27 September 2012
Baptiste Gault, Michael P. Moody, Julie M. Cairney and Simon P. Ringer
Gault et al. address new developments in the emerging area of atom probe crystallography.
This review addresses new developments in the emerging area of “atom probe crystallography”, a materials characterization tool with the unique capacity to reveal both composition and crystallographic structure at the atomic scale. This information is crucial for the manipulation of microstructure for the design of both structural and functional materials with optimized mechanical, electric, optoelectronic, magnetic, or superconducting properties that will find application in, for example, nanoelectronics or energy generation. The ability to extract crystallographic information from 3D atomistic reconstruction has exciting potential synergies with modern modeling techniques, blending experimental and computational methods to extend our insight.
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Materials Today (2012) 15(9), 378-386
Click here to read the Full Text
Materials Today (2012) 15(9), 378-386
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